
Proceedings Paper
Numerical analysis of curved frequency selective surface by finite-difference time-domainFormat | Member Price | Non-Member Price |
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Paper Abstract
Frequency selective surface is a monolayer or multilayer 2D periodic
structure which is composed of multiple resonance units scattering by a
two-dimensional periodic array on dielectric layer. FSS can't absorb radio frequency
energy, but can filter the frequency which is therefore applied in microwave technique
or stealth technology. The relative research on curved FSS is relatively scarce since the
curved FSS structure can be obtained only when FSS is attached on the materials
surfaces of curved structures in engineering application. However, curved FSS is
widely applied in practical engineering; therefore, the research on curved FSS structure
has important significance. In this paper, a curved FSS structure model of Y-pore unit is
established and numerical simulated by means of FDTD. The influence of curvature on
FSS transmission characteristics is studied according to the analysis on the changing of
radar cross section (RCS). The results show: the center frequency point of the plane
band pass FSS structure drifts after the curve surface deformation of the structure; the
center frequency point of the curved band pass FSS structure drifts with the changing of
the curvature radius, i. e. with the decreasing of curvature radius, the frequency point
drifts towards high points and the transmittance decreases. The design of FSS radome
demands of accurate and stable center resonance frequency; therefore, the actual
situation of curved surface should be considered in practical engineering application
when band pass FSS is made into frequency selection filtering radome. The curvature
radius should be long enough to avoid center frequency drifting and transmittance
deceasing.
Paper Details
Date Published: 11 August 2011
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 819509 (11 August 2011); doi: 10.1117/12.899578
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 8195, International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications, 819509 (11 August 2011); doi: 10.1117/12.899578
Show Author Affiliations
Xin-yi Chen, Changchun Univ. of Science and Technology (China)
Jian-bo Wang, Changchun Univ. of Science and Technology (China)
Gui-bo Chen, Changchun Univ. of Science and Technology (China)
Jian-bo Wang, Changchun Univ. of Science and Technology (China)
Gui-bo Chen, Changchun Univ. of Science and Technology (China)
Guan-cheng Sun, Changchun Univ. of Science and Technology (China)
Jun Lu, Changchun Univ. of Science and Technology (China)
Jun Lu, Changchun Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 8195:
International Symposium on Photoelectronic Detection and Imaging 2011: Terahertz Wave Technologies and Applications
X.-C. Zhang; Jianquan Yao; Cunlin Zhang; Zhenzhan Wang, Editor(s)
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