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Proceedings Paper

Mask replication using jet and flash imprint lithography
Author(s): Kosta S. Selinidis; Chris Jones; Gary F. Doyle; Laura Brown; Joseph Imhof; Dwayne L. LaBrake; Douglas J. Resnick; S. V. Sreenivasan
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Paper Abstract

The Jet and Flash Imprint Lithography (J-FILTM) process uses drop dispensing of UV curable resists to assist high resolution patterning for subsequent dry etch pattern transfer. The technology is actively being used to develop solutions for memory markets including Flash memory and patterned media for hard disk drives. It is anticipated that the lifetime of a single template (for patterned media) or mask (for semiconductor) will be on the order of 104 - 105imprints. This suggests that tens of thousands of templates/masks will be required to satisfy the needs of a manufacturing environment. Electron-beam patterning is too slow to feasibly deliver these volumes, but instead can provide a high quality "master" mask which can be replicated many times with an imprint lithography tool. This strategy has the capability to produce the required supply of "working" templates/masks. In this paper, we review the development of the mask form factor, imprint replication tools and the semiconductor mask replication process. A PerfectaTM MR5000 mask replication tool has been developed specifically to pattern replica masks from an ebeam written master. Performance results, including image placement, critical dimension uniformity, and pattern transfer are covered in detail.

Paper Details

Date Published: 13 October 2011
PDF: 12 pages
Proc. SPIE 8166, Photomask Technology 2011, 816627 (13 October 2011); doi: 10.1117/12.898865
Show Author Affiliations
Kosta S. Selinidis, Molecular Imprints, Inc. (United States)
Chris Jones, Molecular Imprints, Inc. (United States)
Gary F. Doyle, Molecular Imprints, Inc. (United States)
Laura Brown, Molecular Imprints, Inc. (United States)
Joseph Imhof, Molecular Imprints, Inc. (United States)
Dwayne L. LaBrake, Molecular Imprints, Inc. (United States)
Douglas J. Resnick, Molecular Imprints, Inc. (United States)
S. V. Sreenivasan, Molecular Imprints, Inc. (United States)

Published in SPIE Proceedings Vol. 8166:
Photomask Technology 2011
Wilhelm Maurer; Frank E. Abboud, Editor(s)

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