
Proceedings Paper
Quantized image patches co-occurrence matrix: a new statistical approach for texture classification using image patch exemplarsFormat | Member Price | Non-Member Price |
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Paper Abstract
The statistical distribution of image patch exemplars has been shown to be an effective approach to texture
classification. In this paper, the joint distribution of pairs of patches for texture classification from single images
is investigated. We developed a statistical method of examining texture that considers the spatial relationship of
image patches, which is called the quantized patches co-occurrence matrix (QPCM). In our method, the images
are first slipt into small image patches, and then the patches are quantized to the closest patch cluster centers
(textons) which is learned form training images. By calculating how often pairs of patches with specific quantized
values (texton labels) and in a specified spatial relationship occur in an image, we create the QPCM for images
representation. Moreover, we developed a fusion framework for texture classification by fusing 4 QPCM functions
with specified neighboring spatial relationship and 3 other statistical representations of image patches, which
is called QPCM-SVM classifier. The effectiveness of the proposed texture classification methodology is demonstrated
via an extensive consistent evaluation in standard benchmarks that clearly shows better performance
against state-of-the-art statistical approach using image patch exemplars.
Paper Details
Date Published: 8 July 2011
PDF: 5 pages
Proc. SPIE 8009, Third International Conference on Digital Image Processing (ICDIP 2011), 80092P (8 July 2011); doi: 10.1117/12.896155
Published in SPIE Proceedings Vol. 8009:
Third International Conference on Digital Image Processing (ICDIP 2011)
Ting Zhang, Editor(s)
PDF: 5 pages
Proc. SPIE 8009, Third International Conference on Digital Image Processing (ICDIP 2011), 80092P (8 July 2011); doi: 10.1117/12.896155
Show Author Affiliations
Zhonghua Liu, Shanghai Institute of Applied Physics (China)
Jingyan Wang, Shanghai Institute of Applied Physics (China)
Yongping Li, Shanghai Institute of Applied Physics (China)
Jingyan Wang, Shanghai Institute of Applied Physics (China)
Yongping Li, Shanghai Institute of Applied Physics (China)
Ying Zhang, Shanghai Institute of Applied Physics (China)
Chao Wang, Oregon Health & Science Univ. (United States)
Chao Wang, Oregon Health & Science Univ. (United States)
Published in SPIE Proceedings Vol. 8009:
Third International Conference on Digital Image Processing (ICDIP 2011)
Ting Zhang, Editor(s)
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