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Proceedings Paper

Visualizing the mode evolution process in passive and active cavities based on the NIW-Principle
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Paper Abstract

This paper will present results of computer models depicting the evolution of diffractive processes through passive and active cavities (traditional stable resonator and single mode fiber) as the number of passes (or the length of propagation) increases. The objective is to visualize how the spatially stable eigen-modes evolve with propagation. Our core assumptions are the validity of the Huygens-Fresnel hypothesis of secondary wavelets and the recently articulated Non- Interaction of Waves (NIW) principle in this conference series. The NIW-principle implies that even the diffracted secondary wavelets propagate conjointly but without re-arranging their spatial energy distribution unless one inserts some interacting material medium within the diffracting beam. Accordingly, we anticipate that the evolution of the measurable energy distribution in the diffraction pattern will be different in the presence of gain medium whose gain profile varies in the direction orthogonal to the cavity axis. We also anticipate that a cavity with high gain profile will generate the stable spatial eigen-mode with a fewer number of passes through the cavity than with lower gain, or no gain. We will also present the mode evolution process when the seed signal is a pulse of length that is shorter than that of the cavity. We believe this paper will provide useful insights to the students who are introduced to the concept of spatially well defined Gaussian laser modes for the first time.

Paper Details

Date Published: 28 September 2011
PDF: 7 pages
Proc. SPIE 8121, The Nature of Light: What are Photons? IV, 81211D (28 September 2011); doi: 10.1117/12.895167
Show Author Affiliations
Narasimha S. Prasad, NASA Langley Research Ctr. (United States)
Chandrasekhar Roychoudhuri, Univ. of Connecticut (United States)

Published in SPIE Proceedings Vol. 8121:
The Nature of Light: What are Photons? IV
Chandrasekhar Roychoudhuri; Andrei Yu. Khrennikov; Al F. Kracklauer, Editor(s)

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