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Proceedings Paper

Simulation and optimization of the NSLS-II SRX beamline combining ray-tracing and wavefront propagation
Author(s): Vincent De Andrade; Juergen Thieme; Oleg Chubar; Mourad Idir
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Paper Abstract

The Sub-micron Resolution X-ray spectroscopy (SRX) beamline will benefit from the ultralow emittance of the National Synchrotron Light Source II to address a wide variety of scientific applications studying heterogeneous systems at the sub-micrometer scale. This work focuses on the KB branch (ΔE: 4.65-28 keV). Its main optical components include a horizontally focusing mirror forming an adjustable secondary source, a horizontally deflecting monochromator and two sets of Kirkpatrick-Baez mirrors as focusing optics of two distinct inline stations for operations requiring either high flux or high resolution. In the first approach, the beamline layout was optimized with ray-tracing calculations involving Shadowvui computer codes. As a result, the location and characteristics of optics were specified for achieving either the most intense or the smallest monochromatic beam possible on the target (1013 ph/s or 1012 ph/s respectively in a 500 nm or 65 nm focal spot). At the nanoprobe station, the diffraction limited focusing of X-rays is governed by the beam coherence. Hence, a classical geometric approach is not anymore adapted. To get reliable estimates of the Nanoprobe performances, a wavefront propagation study was performed using Synchrotron Radiation Workshop (SRW) code. At 7.2 keV, calculations show an intense (1012 ph/s) 67 nm wide diffraction limited spot achieved with actual metrological data of mirrors.

Paper Details

Date Published: 23 September 2011
PDF: 10 pages
Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 81410L (23 September 2011); doi: 10.1117/12.894954
Show Author Affiliations
Vincent De Andrade, Brookhaven National Lab. (United States)
Juergen Thieme, Brookhaven National Lab. (United States)
Oleg Chubar, Brookhaven National Lab. (United States)
Mourad Idir, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 8141:
Advances in Computational Methods for X-Ray Optics II
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)

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