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Proceedings Paper

Metrology of IXO mirror segments
Author(s): Kai-Wing Chan; Melinda Hong; Timo Saha; William Zhang
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Paper Abstract

For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements.

Paper Details

Date Published: 11 October 2011
PDF: 12 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814716 (11 October 2011); doi: 10.1117/12.894347
Show Author Affiliations
Kai-Wing Chan, Univ. of Maryland, Baltimore County (United States)
NASA Goddard Space Flight Ctr. (United States)
Melinda Hong, SGT, Inc. (United States)
Timo Saha, NASA Goddard Space Flight Ctr. (United States)
William Zhang, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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