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Proceedings Paper

ASTRO-H Soft X-ray Telescope (SXT)
Author(s): Yang Soong; Peter J. Serlemitsos; Takashi Okajima; Devin Hahne
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Paper Abstract

ASTRO-H is an astrophysics satellite dedicated for X-ray spectroscopic study non-dispersively and to carry out survey complementally, which will be borne out of US-Japanese collaborative effort. Among the onboard instruments there are four conically approximated Wolter-I X-ray mirrors, among which two of them are soft X-ray mirrors1, of which the energy range is from a few hundred eV to 15 keV, currently being fabricated in the X-ray Optics Lab at Goddard Space Flight Center. The focal point instruments will be a calorimeter (SXS) and a CCD camera (SXI), respectively. The reflectors of the mirror are made of heat-formed aluminum substrate of the thickness gauged of 152 μm, 229 μm, and 305 μm of the alloy 5052 H-19, followed by epoxy replication on gold-sputtered smooth Pyrex cylindrical mandrels to acquire the X-ray reflective surface. The epoxy layer is 10 μm nominal and surface gold layer of 0.2 μm. Improvements on angular response over the Astro-E1/Suzaku mirrors come from error reduction on the figure, the roundness, and the grazing angle/radius mismatching of the reflecting surface, and tighter specs and mechanical strength on supporting structure to reduce the reflector positioning and the assembly errors. In this paper, we report the results of calibration of the engineering model of SXT (EM), and project the quality of the flight mirrors.

Paper Details

Date Published: 30 September 2011
PDF: 9 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814702 (30 September 2011); doi: 10.1117/12.894305
Show Author Affiliations
Yang Soong, The Ctr. for Research and Exploration in Space Science (United States)
Universities Space Research Association (United States)
Peter J. Serlemitsos, NASA Goddard Space Flight Ctr. (United States)
Takashi Okajima, NASA Goddard Space Flight Ctr. (United States)
Devin Hahne, Bastion Technologies, Inc (United States)

Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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