
Proceedings Paper
Printed thin film transistor: materials and applicationsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The combination of organic semiconductors and emerging
solution-dispersible metal and metal oxide nanoparticles
and nanowires enables the fabrication of electronic devices that are fully built from solution. This establishes a new
device-processing platform that, in turn allows integration of functionality in systems not feasible in any
conventional semiconductor technology. Examples of novel applications and systems enabled by this include:
large-area, ultra light and flexible power harvesting,
logic-integrated sensing and memory technologies. In this
paper we discuss the use of organic Thin Film Transistors (TFTs) based on printed solution-processed materials for
displays and memory applications. Polarizable solution-processed dielectrics and polymer semiconductors were
integrated in the fabrication of non-volatile analog memory arrays. The stability of memory TFTs over 7 days was
studied and characterized, and a stable process to achieve all printed TFTs is presented.
Paper Details
Date Published: 7 September 2011
PDF: 7 pages
Proc. SPIE 8117, Organic Field-Effect Transistors X, 81170Y (7 September 2011); doi: 10.1117/12.894182
Published in SPIE Proceedings Vol. 8117:
Organic Field-Effect Transistors X
Zhenan Bao; Iain McCulloch, Editor(s)
PDF: 7 pages
Proc. SPIE 8117, Organic Field-Effect Transistors X, 81170Y (7 September 2011); doi: 10.1117/12.894182
Show Author Affiliations
Ana Claudia Arias, Palo Alto Research Ctr., Inc. (United States)
Tse Nga Ng, Palo Alto Research Ctr., Inc. (United States)
Tse Nga Ng, Palo Alto Research Ctr., Inc. (United States)
Gregory L. Whiting, Palo Alto Research Ctr., Inc. (United States)
Jürgen Daniel, Palo Alto Research Ctr., Inc. (United States)
Jürgen Daniel, Palo Alto Research Ctr., Inc. (United States)
Published in SPIE Proceedings Vol. 8117:
Organic Field-Effect Transistors X
Zhenan Bao; Iain McCulloch, Editor(s)
© SPIE. Terms of Use
