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Proceedings Paper

ESA-led ATHENA/IXO optics development status
Author(s): Marcos Bavdaz; Nicola Rando; Eric Wille; Kotska Wallace; Brian Shortt; Maximilien Collon; Coen van Baren; Giovanni Pareschi; Finn Christensen; Michael Krumrey; Michael Freyberg
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Paper Abstract

The International X-ray Observatory (IXO) is a candidate mission in the ESA Space Science Programme Cosmic Vision 1525, and was studied as a joint mission with NASA and JAXA. Considering the programmatic evolution of the international context, the mission is being reformulated as an ESA-led mission, under the name of ATHENA (Advanced Telescope for High Energy Astrophysics), with possible participation of NASA and JAXA. The mission is building on the novel Silicon Pore Optics (SPO) technology to achieve the required performance for this demanding astrophysics observatory. This technology is being developed by an industrial consortium, and involves also several research institutes [1-12]. A second optics technology, slumped glass optics (SGO), which is being developed in Europe and the USA, was the backup technology for IXO, and additionally work is progressing on improved reflective coatings and X-ray test facilities [13-17].

Paper Details

Date Published: 6 October 2011
PDF: 8 pages
Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 81470C (6 October 2011);
Show Author Affiliations
Marcos Bavdaz, European Space Agency, ESTEC (Netherlands)
Nicola Rando, European Space Agency, ESTEC (Netherlands)
Eric Wille, European Space Agency, ESTEC (Netherlands)
Kotska Wallace, European Space Agency, ESTEC (Netherlands)
Brian Shortt, European Space Agency, ESTEC (Netherlands)
Maximilien Collon, cosine Research B.V. (Netherlands)
Coen van Baren, SRON Nationaal Instituut voor Ruimteonderzoek (Netherlands)
Giovanni Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)
Finn Christensen, DTU Space, Technical Univ. of Denmark (Denmark)
Michael Krumrey, Physikalisch-Technische Bundesanstalt (Germany)
Michael Freyberg, Max-Planck-Institut für extraterrestrische Physik (Germany)

Published in SPIE Proceedings Vol. 8147:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy V
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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