
Proceedings Paper
Optical bonding reinforced by femtosecond laser weldingFormat | Member Price | Non-Member Price |
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Paper Abstract
Previous work on welding of optical materials with ultrashort laser pulses demonstrated that the ability to
achieve good contact between components limits the applicability of the technology to only very small components. We
have overcome this limitation and demonstrated the capability to weld similar and dissimilar materials using
femtosecond laser pulses over several mm2 areas between intimately contacted surfaces. Our joining process is realised
in two steps. Firstly, the two pieces which must be joined are direct bonded, thereby inducing optical contact throughout
the whole potentially bondable surface. Subsequently, the direct bond is reinforced by the inscription of femtosecond
laser weld seams in a sealing pattern in order to enclose the central region of the direct bond. We demonstrated the
applicability of this process to identical glass, dissimilar glass and glass-semiconductor. We also measured a mean
threefold increase in joint strength for such bonds between fused silica windows with only a few welding seams. The
final assembly is free from macroscopic surface deformations. Furthermore, by optimizing the laser exposure
parameters, we can avoid microscopic defects inside and around weld seams. Finally, the bonding method does not alter
the optical transmission properties at the center of the sealed region. As opposed to the use of adhesives, such bonds
resist to important thermal constraints and are free from chemical contaminants, degassing and ageing. Potential
applications may be considered in the fields of aerospace, laser manufacturing, semiconductor industry, solar cell
protection, precision manufacturing and many more.
Paper Details
Date Published: 27 September 2011
PDF: 13 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 812612 (27 September 2011); doi: 10.1117/12.892465
Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)
PDF: 13 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 812612 (27 September 2011); doi: 10.1117/12.892465
Show Author Affiliations
Fabrice Lacroix, Institut Franco-Allemand de Recherches de Saint-Louis (France)
David Hélie, COPL, Univ. Laval (Canada)
David Hélie, COPL, Univ. Laval (Canada)
Réal Vallée, COPL, Univ. Laval (Canada)
Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)
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