
Proceedings Paper
Software configurable optical test system for refractive opticsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
SCOTS (software configurable optical test system) is a useful tool that can provide lens manufacturers with the ability to
evaluate the net performance of a lens system without the use of complex metrology systems and setups. This technique
is based on measuring the transverse ray aberrations of rays to obtain wavefront information using transmission
deflectometry, the refractive equivalent of reflection deflectometry.
Some work using deflectometry on refractive surfaces has been briefly reported in the past, where the power of a single
lens has been the measurement objective. Results showing the use of deflectometry on reflective optical surfaces, such
as the primary mirror of the Giant Magellan Telescope (GMT) show that this method has a large dynamic range in
which measurement accuracy is comparable with those of interferometric methods; generating interest on our part, to
investigate deflectometry for refractive systems in more detail.
In this paper, we focus on reporting initial tests using SCOTS by measuring simple refractive elements, such as 1"
diameter biconvex BK7 lenses. Results indicate a good agreement when comparing them with equivalent
MATLAB/ZEMAX wavefront measuring models, which include the measured lens parameters, where the estimated and
measured wavefront RMS values and spherical aberration Zernike coefficient agree on average to within 10nm. We also
investigate the effect of the chromatic aberration on the refractive optical system by collecting data using three different
wavelengths: 620nm, 550nm and 450nm. The alignment of the test setup was done rapidly and we used an LCD screen
with a pixel pitch of 0.1905mm. The camera used for the measurements was a simple digital CCD camera.
Paper Details
Date Published: 27 May 2011
PDF: 6 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80823H (27 May 2011); doi: 10.1117/12.890026
Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)
PDF: 6 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80823H (27 May 2011); doi: 10.1117/12.890026
Show Author Affiliations
Margaret Z. Dominguez, College of Optical Sciences, The Univ. of Arizona (United States)
Lirong Wang, College of Optical Sciences, The Univ. of Arizona (United States)
Peng Su, College of Optical Sciences, The Univ. of Arizona (United States)
Lirong Wang, College of Optical Sciences, The Univ. of Arizona (United States)
Peng Su, College of Optical Sciences, The Univ. of Arizona (United States)
Robert E. Parks, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)
Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)
© SPIE. Terms of Use
