Share Email Print

Proceedings Paper

Exploiting chromatic aberration to spectrally encode depth in reflectance confocal microscopy
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present chromatic confocal microscopy as a technique to axially scan the sample by spectrally encoding depth information to avoid mechanical scanning of the lens or sample. We have achieved an 800 μm focal shift over a range of 680-1080 nm using a hyperchromat lens as the imaging lens. A more complex system that incorporates a water immersion objective to improve axial resolution was built and tested. We determined that increasing objective magnification decreases chromatic shift while improving axial resolution. Furthermore, collimating after the hyperchromat at longer wavelengths yields an increase in focal shift.

Paper Details

Date Published: 8 June 2011
PDF: 7 pages
Proc. SPIE 8086, Advanced Microscopy Techniques II, 80861D (8 June 2011);
Show Author Affiliations
Oscar Carrasco-Zevallos, Texas A&M Univ. (United States)
Ryan L. Shelton, Texas A&M Univ. (United States)
Cory Olsovsky, Texas A&M Univ. (United States)
Meagan Saldua, Texas A&M Univ. (United States)
Brian E. Applegate, Texas A&M Univ. (United States)
Kristen C. Maitland, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 8086:
Advanced Microscopy Techniques II
Peter T. C. So; Emmanuel Beaurepaire, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?