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Proceedings Paper

Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces
Author(s): J. A. Böhm; A. Vernes; G. Vorlaufer; M. J. Vellekoop
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Paper Abstract

Grinding processes causes the formation of a characteristic surface structure, known as chatter marks. In this work, an angle-resolved light scattering technique is used to characterise them. In order to identify the chatter marks in a measured profile, the fast Fourier transform (FFT) is usually applied to the measured data. The FFT, however only for strictly periodic data yields unambiguous results. To overcome this, the multiresolution analysis (MRA) is also applied by means of the lifting scheme. In this manner, it is shown that chatter marks, for example, can be uniquely identified by applying the multiresolution analysis to the angle-resolved light scattering data, even when FFT fails to do this. Thus MRA alone or alternatively in combination with FFT, opens new opportunities for optical online control in case of industrial surface finishing processes.

Paper Details

Date Published: 27 May 2011
PDF: 8 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808238 (27 May 2011); doi: 10.1117/12.889488
Show Author Affiliations
J. A. Böhm, Austrian Ctr. of Competence for Tribology (Austria)
A. Vernes, Austrian Ctr. of Competence for Tribology (Austria)
Vienna Univ. of Technology (Austria)
G. Vorlaufer, Austrian Ctr. of Competence for Tribology (Austria)
M. J. Vellekoop, Vienna Univ. of Technology (Austria)

Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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