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Proceedings Paper

Hybrid light source for scanning white light interferometry-based MEMS quality control
Author(s): V. Heikkinen; K. Hanhijärvi; J. Aaltonen; H. Räikkönen; B. Wälchli; T. Paulin; I. Kassamakov; K. Grigoras; S. Franssila; E. Hæggström
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Paper Abstract

We apply a hybrid light source with adjustable spectrum to Scanning White Light Interferometric MEMS device characterization. The source combines light from a blue laser (409 nm), a fluorescent material (emission peak 521 nm), amber LED (597 nm) and cyan LED (505 nm) to cover the visible wavelengths. The Gaussian spectrum of the light source reduces interference ringing and improves surface localization, which is important when imaging diffuse surfaces or layered structures. The new light source allows both stroboscopic illumination and spectrum shaping during a measurement. Changing the illumination spectrum allows one to maximize the reflection from the measured surface - compared to reflections from other surfaces - as a mean to improve signal-to-noise-ratio. To validate the source we measured static MEMS samples featuring known step heights using the light source at three different mean wavelengths (508 nm, 524 nm and 579 nm). The measured step heights (7.029 ± 0.045 μm, 7.002 ± 0.041 μm and 7.005 ± 0.056 μm) were close to those measured using a halogen lamp (7.025 ± 0.020 μm). Interferograms without the side lobes typical for white LEDs were achieved. The FWHM of the interferogram of the combined light source was (1.859 ± 0.008 μm).

Paper Details

Date Published: 27 May 2011
PDF: 8 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80822O (27 May 2011); doi: 10.1117/12.889362
Show Author Affiliations
V. Heikkinen, Univ. of Helsinki (Finland)
K. Hanhijärvi, Univ. of Helsinki (Finland)
J. Aaltonen, Helsinki Institute of Physics (Finland)
H. Räikkönen, Univ. of Helsinki (Finland)
B. Wälchli, Univ. of Helsinki (Finland)
T. Paulin, Univ. of Helsinki (Finland)
I. Kassamakov, Univ. of Helsinki (Finland)
Helsinki Institute of Physics (Finland)
K. Grigoras, Aalto Univ. School of Science and Technology (Finland)
S. Franssila, Aalto Univ. School of Science and Technology (Finland)
E. Hæggström, Univ. of Helsinki (Finland)

Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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