
Proceedings Paper
Contrast modification for ultra-high resolution low-coherence interference microscopy by Fourier-plane filteringFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a novel full-field low-coherence interference (LCI) microscope, which exhibits ultra-high axial resolution due
to a broadband super continuum light source and which is at the same time capable to generate different contrast modes
by using Fourier-plane filtering with a spatial light modulator. By changing the phase and spatial frequencies of the backreflected
wavefront of the specimen in the sample arm of the interferometer, we are able to change the contrast in the
depth-resolved LCI images. By displaying different filters on the SLM, as e.g. spiral phase, the resulting images provide
particular enhancement of edges and internal structures, and expose details within the specimen that are not visible in
normal bright-field mode.
Paper Details
Date Published: 1 June 2011
PDF: 6 pages
Proc. SPIE 8091, Optical Coherence Tomography and Coherence Techniques V, 809109 (1 June 2011); doi: 10.1117/12.889330
Published in SPIE Proceedings Vol. 8091:
Optical Coherence Tomography and Coherence Techniques V
Rainer A. Leitgeb; Brett E. Bouma, Editor(s)
PDF: 6 pages
Proc. SPIE 8091, Optical Coherence Tomography and Coherence Techniques V, 809109 (1 June 2011); doi: 10.1117/12.889330
Show Author Affiliations
Stefan E. Schausberger, Johannes Kepler Univ. Linz (Austria)
Bettina Heise, Johannes Kepler Univ. Linz (Austria)
Christian Maurer, Innsbruck Medical Univ. (Austria)
Bettina Heise, Johannes Kepler Univ. Linz (Austria)
Christian Maurer, Innsbruck Medical Univ. (Austria)
Stefan Bernet, Innsbruck Medical Univ. (Austria)
Monika Ritsch-Marte, Innsbruck Medical Univ. (Austria)
David Stifter, Johannes Kepler Univ. Linz (Austria)
Monika Ritsch-Marte, Innsbruck Medical Univ. (Austria)
David Stifter, Johannes Kepler Univ. Linz (Austria)
Published in SPIE Proceedings Vol. 8091:
Optical Coherence Tomography and Coherence Techniques V
Rainer A. Leitgeb; Brett E. Bouma, Editor(s)
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