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Proceedings Paper

A high spatial resolution CsI:Tl scintillation film based on net-like substrate
Author(s): Wei Zhang; Mu Gu; Dalin Yao; Xiaolin Liu; Shimin Huang; Bo Liu; Chen Ni
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Paper Abstract

CsI:Tl scintillation films were prepared on the net-like patterning substrates. The pattern of the substrates as well as the morphology of the CsI:Tl films were measured by SEM. The results show that the size of each grid on substrate is 55μm which is formed by SU-8 photoresist with 5μm in both height and width, and the CsI:Tl films display quite a good columnar structure. The spatial resolutions of X-ray imaging were taken by MTF measurement. The spatial frequency of the CsI:Tl films on patterned substrates can reach up to 10 lp/mm at the 10% level of MTF, which is twice higher than that of the CsI:Tl film on the substrate without patterning.

Paper Details

Date Published: 18 February 2011
PDF: 4 pages
Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951P (18 February 2011); doi: 10.1117/12.888355
Show Author Affiliations
Wei Zhang, Tongji Univ. (China)
Mu Gu, Tongji Univ. (China)
Dalin Yao, Tongji Univ. (China)
Xiaolin Liu, Tongji Univ. (China)
Shimin Huang, Tongji Univ. (China)
Bo Liu, Tongji Univ. (China)
Chen Ni, Tongji Univ. (China)

Published in SPIE Proceedings Vol. 7995:
Seventh International Conference on Thin Film Physics and Applications
Junhao Chu; Zhanshan Wang, Editor(s)

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