Share Email Print

Proceedings Paper

Solving SOC test scheduling problem using cross-entropy method
Author(s): Libao Deng; Liyan Qiao; Xiyuan Peng
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.

Paper Details

Date Published: 28 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754427 (28 December 2010); doi: 10.1117/12.885817
Show Author Affiliations
Libao Deng, Harbin Institute of Technology (China)
Liyan Qiao, Harbin Institute of Technology (China)
Xiyuan Peng, Harbin Institute of Technology (China)

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?