Share Email Print

Proceedings Paper

Application of machine vision based measurement in precise assembly of miniature parts
Author(s): Cui Zhu; Xiaodong Wang; Xiwen Zhang; Lin Wang; Yi Luo
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In manufacturing of precise miniature devices, automatic assembly is the trend to replace manual work for better quality and higher yield. Precise measurement is a critical issue during assembly process because the parts are often complicated and quite different in size, shapes, surface condition, etc. The position and orientation error must be determined precisely before assembly. In the developed automatic assembly system, microscopic machine vision and precise linear stages were integrated in the measurement system for higher detection resolution and larger measurement range in working space. As to the extract of contour of parts with different surface condition, dynamic illumination control and different combination of feature detection algorithms were applied. The errors brought by non-perpendicularity among precision linear stages were compensated and the movement errors were reduced with effective measurement strategy. The measuring accuracy was validated with a special fabricated precise template. Assembly tests were done with the developed system and results indicate that the required position and orientation accuracy can be met successfully and consequently the assembly task can be fulfilled.

Paper Details

Date Published: 28 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442L (28 December 2010); doi: 10.1117/12.885803
Show Author Affiliations
Cui Zhu, Dalian Univ. of Technolgy (China)
Xiaodong Wang, Dalian Univ. of Technolgy (China)
Xiwen Zhang, Dalian Univ. of Technolgy (China)
Lin Wang, Dalian Univ. of Technolgy (China)
Yi Luo, Dalian Univ. of Technolgy (China)

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?