Share Email Print

Proceedings Paper

Calibration of 3D laser measurement system based on projective transformation
Author(s): Yang Guo; Yue-yang Du; Zheng-chun Du; Zhen-qiang Yao
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents a planar projective transformation based method for fully automated exterior and interior calibration of a three-dimensional laser scanning system. The calibration is crucial for applications that attempt to produce accurately registered or fused three-dimensional sensor data. A key contribution of the method lies in the derivation of transformation relations that describe the same point in three defined coordinate systems with respect to the rotating characteristic of two scanning planes and its calibration target object whose geometric feature can be reliably recognized from a single observation. The transformation relationship can be converted to the closed-form solution to the constraint equations of the system parameters in the form of intrinsic and extrinsic matrices. By deriving the relationship between a single two-dimensional range scan and the point location presentation in the absolute frame, the interior and exterior calibration can be accomplished simultaneously and the algorithm of the 6 DOF pose improves the identification precision. Finally, this paper reports the performance and stability of this method on real data sets, and demonstrates the accuracy within ±0.1 degree of the orientation precision and 8mm of position precision in a realistic configuration.

Paper Details

Date Published: 31 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75445I (31 December 2010); doi: 10.1117/12.885428
Show Author Affiliations
Yang Guo, Shanghai Jiao Tong Univ. (China)
Yue-yang Du, Shanghai Jiao Tong Univ. (China)
Zheng-chun Du, Shanghai Jiao Tong Univ. (China)
Zhen-qiang Yao, Shanghai Jiao Tong Univ. (China)

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?