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Proceedings Paper

Continuous monitoring of plant growth using fiber-optic interferrometric sensing
Author(s): Julius Chatterjee; Barry G. Grossman
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Paper Abstract

Dendrometers, dendrographs and dry weight measurements have been successfully used for measurements of plant growth. These sensors have been used with Linear Variable Differential Transformer (LVDT) based data logging systems for continuous monitoring. In this paper the preliminary results for a prototype technique is presented as a proof of concept for the continuous monitoring of plant growth using an approach based on fiber-optic interferrometric sensing. The advantage of this sensing technique over the others is the ability to measure and analyze with very high sensitivities such as micron changes in dimensions allowing measurements over short time spans. The sensor was mounted on a Dracaena Sanderiana (Lucky Bamboo) shoot and the change in shoot length dimensions resulted in changes in the output signal display which is in the form of interferrometric fringes. The data acquisition is performed over a long duration using labVIEW based data logging. Filtered output of the data has been presented where an attempt has been made to relate the fringes to length changes. The sensing system is nondestructive and noninvasive and has been targeted to respond to changes in stem length due to changes in plant growth parameters. The objective is to provide a measurement system to do research in optimizing plant growth in greatly reduced time spans. This form of sensing application is also applicable for monitoring the growth of plants growing at much slower rates.

Paper Details

Date Published: 2 June 2011
PDF: 11 pages
Proc. SPIE 8028, Fiber Optic Sensors and Applications VIII, 80280P (2 June 2011); doi: 10.1117/12.885049
Show Author Affiliations
Julius Chatterjee, Florida Institute of Technology (United States)
Barry G. Grossman, Florida Institute of Technology (United States)

Published in SPIE Proceedings Vol. 8028:
Fiber Optic Sensors and Applications VIII
Stephen J. Mihailov; Henry H. Du; Gary Pickrell, Editor(s)

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