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Proceedings Paper

Passive SWIR airglow illuminated imaging compared with NIR-visible for low-light nighttime observations
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Paper Abstract

It is well known that luminance from photo-chemical reactions of hydroxyl ions in the upper atmosphere (~85 km altitude) produces a significant amount of night time radiation in the short wave infra-red (SWIR) band with wavelength between 0.9 and 1.7 μm. By examining images in an urban and a rural setting, we investigate the correlation between the appearances of passive dark of night images in the SWIR with NIR- visible. The experimental setup consists of two sensors, a NIR-visible CCD and an InGaAs array sensitive in the SWIR, both colocated on an AZ-EL mount, and both co-boresighted so that different viewing angles of the sky and terrestrial scenes are possible. By making corrections for focal length and pixel size, the visible and SWIR data can be compared. After taking several nights of data in the urban environment of Albuquerque, NM, the entire system was then re-located to a rural location on the island of Kauai in a rural setting with very low ambient light. It is shown that under most conditions the SWIR sensor produces significantly better imagery using the airglow illumination source.

Paper Details

Date Published: 9 May 2011
PDF: 10 pages
Proc. SPIE 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII, 801407 (9 May 2011); doi: 10.1117/12.884233
Show Author Affiliations
David C. Dayton, Applied Technology Associates (United States)
Jeffery Allen, Applied Technology Associates (United States)
Rudolph Nolasco, Air Force Research Lab. (United States)
John D. Gonglewski, Applied Technology Associates (United States)
Michael Myers, Air Force Research Lab. (United States)
Dennis Burns, Textron Defense Systems (United States)
Ishan Mons, Textron Defense Systems (United States)
Francisco Maia, Textron Defense Systems (United States)

Published in SPIE Proceedings Vol. 8014:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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