Proceedings Paper
Pulsed terahertz bi-directional reflection distribution function (BRDF) measurements of materials and obscurants| Format | Member Price | Non-Member Price |
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Paper Abstract
A pulsed terahertz imaging system modified to perform angular detection of light for quantitatively characterizing
reflection and scattering from samples is reported. Reflection from a gold mirror shows that the full width half maximum
(FWHM) of the terahertz beam angular spread is < 1° with signal-to-noise of 65 dB. Two samples, a paper index card
and a corduroy cloth sample were tested. The index card reflects ca. 1% of the incident terahertz energy with similar
angular spreading while the corduroy sample reflected approximately 0.01% of the incident terahertz energy with
FWHM of 5 - 10°. The corduroy sample also exhibits temporal pulse scattering as a function of angle which correlates
with direct frequency domain measurements.
Paper Details
Date Published: 26 May 2011
PDF: 8 pages
Proc. SPIE 8022, Passive Millimeter-Wave Imaging Technology XIV, 80220G (26 May 2011); doi: 10.1117/12.883738
Published in SPIE Proceedings Vol. 8022:
Passive Millimeter-Wave Imaging Technology XIV
David A. Wikner; Arttu R. Luukanen, Editor(s)
PDF: 8 pages
Proc. SPIE 8022, Passive Millimeter-Wave Imaging Technology XIV, 80220G (26 May 2011); doi: 10.1117/12.883738
Show Author Affiliations
Shu-Zee A. Lo, National Institute of Standards and Technology (United States)
Univ. of Maryland at College Park (United States)
David Novotny, National Institute of Standards and Technology (United States)
Univ. of Maryland at College Park (United States)
David Novotny, National Institute of Standards and Technology (United States)
Erich N. Grossman, National Institute of Standards and Technology (United States)
Edwin J. Heilweil, National Institute of Standards and Technology (United States)
Edwin J. Heilweil, National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 8022:
Passive Millimeter-Wave Imaging Technology XIV
David A. Wikner; Arttu R. Luukanen, Editor(s)
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