
Proceedings Paper
Graph theoretic metrics for spectral imagery with application to change detectionFormat | Member Price | Non-Member Price |
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Paper Abstract
Many spectral algorithms that are routinely applied to spectral imagery are based on the following models:
statistical, linear mixture, and linear subspace. As a result, assumptions are made about the underlying distribution
of the data such as multivariate normality or other geometric restrictions. Here we present a graph based
model for spectral data that avoids these restrictive assumptions and apply graph based metrics to quantify
certain aspects of the resulting graph. The construction of the spectral graph begins by connecting each pixel to
its k-nearest neighbors with an undirected weighted edge. The weight of each edge corresponds to the spectral
Euclidean distance between the adjacent pixels. The number of nearest neighbors, k, is chosen such that the
graph is connected i.e., there is a path from each pixel xi to every other. This requirement ensures the existence
of inter-cluster connections which will prove vital for our application to change detection. Once the graph
is constructed, we calculate a metric called the Normalized Edge Volume (NEV) that describes the internal
structural volume based on the vertex connectivity and weighted edges of the graph. Finally, we demonstrate
a graph based change detection method that applies this metric.
Paper Details
Date Published: 23 May 2011
PDF: 12 pages
Proc. SPIE 8048, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVII, 804809 (23 May 2011); doi: 10.1117/12.883574
Published in SPIE Proceedings Vol. 8048:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
PDF: 12 pages
Proc. SPIE 8048, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVII, 804809 (23 May 2011); doi: 10.1117/12.883574
Show Author Affiliations
James A. Albano, Rochester Institute of Technology (United States)
David W. Messinger, Rochester Institute of Technology (United States)
David W. Messinger, Rochester Institute of Technology (United States)
Ariel Schlamm, Rochester Institute of Technology (United States)
William Basener, Rochester Institute of Technology (United States)
William Basener, Rochester Institute of Technology (United States)
Published in SPIE Proceedings Vol. 8048:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XVII
Sylvia S. Shen; Paul E. Lewis, Editor(s)
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