
Proceedings Paper
Integration of CMM software standards for nanopositioning and nanomeasuring machinesFormat | Member Price | Non-Member Price |
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Paper Abstract
The paper focuses on the utilization of nanopositioning and nanomeasuring machines as a three dimensional coordinate
measuring machine by means of the international harmonized communication protocol Inspection plus plus for
Dimensional Measurement Equipment (abbreviated I++DME). I++DME was designed 1999 to enable the
interoperability of different measuring hardware, like coordinate measuring machines, form tester, camshaft or
crankshaft measuring machines, with a priori unknown third party controlling and analyzing software.
Our recent work was focused on the implementation of a modular, standard conform command interpreter server for the
Inspection plus plus protocol. This communication protocol enables the application of I++DME compliant graphical
controlling software, which is easy to operate and less error prone than the currently used textural programming via
MathWorks MATLab.
The function and architecture of the I++DME command interpreter is discussed and the principle of operation is
demonstrated by means of an example controlling a nanopositioning and nanomeasuring machine with Hexagon
Metrology's controlling and analyzing software QUINDOS 7 via the I++DME command interpreter server.
Paper Details
Date Published: 13 May 2011
PDF: 10 pages
Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80312G (13 May 2011); doi: 10.1117/12.882822
Published in SPIE Proceedings Vol. 8031:
Micro- and Nanotechnology Sensors, Systems, and Applications III
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
PDF: 10 pages
Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80312G (13 May 2011); doi: 10.1117/12.882822
Show Author Affiliations
E. Sparrer, Technical Univ. Ilmenau (Germany)
T. Machleidt, Technical Univ. Ilmenau (Germany)
T. Hausotte, Technical Univ. Ilmenau (Germany)
T. Machleidt, Technical Univ. Ilmenau (Germany)
T. Hausotte, Technical Univ. Ilmenau (Germany)
Published in SPIE Proceedings Vol. 8031:
Micro- and Nanotechnology Sensors, Systems, and Applications III
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)
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