Share Email Print

Proceedings Paper

Quality politics: an immaterial investment for companies in (micro)electronics
Author(s): I. C. Bacivarov; R. Lupan; C. Robledo; Angelica Bacivarov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

With the globalization of the markets and the growth of competitiveness in the manufacturing sector, quality has become a key factor of success. Quality is particularly important for the companies which activate in the micro(electronics) field. The quality management system holds a vital place in the company's structure. Implementing such a system requires important operating costs. These costs are known as Quality Obtaining Costs (QOC) and may be considered as an investment. Planning an investment, means evaluating its return in order to see if it is profitable or not. Measuring the return of quality politics investment raise some delicate problems. We may calculate some aspects of the return of investment by measuring the shape of non-quality costs. An eventual decrease of these costs could be synonym with a profitable investment. But the advantages of good quality politics cannot be measured only by taking into consideration the non-quality costs (even if they include direct and indirect costs). There are also intangible advantages (like mark image, competences, polyvalence, client's satisfaction...) that derive from quality approaches. How to evaluate this type of consequences / advantages? The idea developed in this article is to considerate the quality politics like un immaterial/intelligent investment. Therefore could it be advantageous / possible to use the immaterial investment's measuring and evaluation techniques for studying the quality politics return of investment?

Paper Details

Date Published: 3 December 2010
PDF: 10 pages
Proc. SPIE 7821, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V, 78210S (3 December 2010); doi: 10.1117/12.882295
Show Author Affiliations
I. C. Bacivarov, Politehnica Univ. of Bucharest (Romania)
R. Lupan, Lasquo Lab., CNRS, Univ. d'Angers (France)
C. Robledo, Lasquo Lab., CNRS, Univ. d'Angers (France)
Angelica Bacivarov, Politehnica Univ. of Bucharest (Romania)

Published in SPIE Proceedings Vol. 7821:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V
Paul Schiopu; George Caruntu, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?