
Proceedings Paper
Art documentation quality in function of 3D scanning resolution and precisionFormat | Member Price | Non-Member Price |
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Paper Abstract
Currently, a lot of different 3D scanning devices are used for 3D acquisition of art artifact surface shape and color. Each
of them has different technical parameters starting from measurement principle (structured light, laser triangulation,
interferometry, holography) and ending on parameters like measurement volume size, spatial resolution and precision of
output data and color information. Some of the 3D scanners can grab additional information like surface normal vectors,
BRDF distribution, multispectral color. In this paper, the problem of establishing of threshold for technical parameters of
3D scanning process as a function of required information about the object is discussed. Only two main technical
parameters are under consideration, in order to cover as many different 3D scanning devices as possible - measurement
sampling density (MSD - represented by number of points per square millimeter) and measurement uncertainty (MU - directly influencing final data accuracy). Also different materials and finishing techniques require different thresholds of MSD and MU parameters to collect similar documentation (for example documentation of object state for art conservation department) of different objects. In this paper we consider exemplary painting on canvas, wallpainting, graphics prints and stone samples to visualize what object features can be observed within different values of MSD and MU parameters.
Paper Details
Date Published: 8 March 2011
PDF: 11 pages
Proc. SPIE 7869, Computer Vision and Image Analysis of Art II, 78690D (8 March 2011); doi: 10.1117/12.876647
Published in SPIE Proceedings Vol. 7869:
Computer Vision and Image Analysis of Art II
David G. Stork; Jim Coddington; Anna Bentkowska-Kafel, Editor(s)
PDF: 11 pages
Proc. SPIE 7869, Computer Vision and Image Analysis of Art II, 78690D (8 March 2011); doi: 10.1117/12.876647
Show Author Affiliations
Jakub Michonski, Warsaw Univ. of Technology (Poland)
Published in SPIE Proceedings Vol. 7869:
Computer Vision and Image Analysis of Art II
David G. Stork; Jim Coddington; Anna Bentkowska-Kafel, Editor(s)
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