
Proceedings Paper
3D optical trapping calibration and optical micromanipulation using 808-nm diode-laser barFormat | Member Price | Non-Member Price |
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Paper Abstract
It has recently been demonstrated that diode laser bars can be used to not only optically trap red blood cells in flowing
microfluidic systems but also, stretch, bend, and rotate them. To predict the complex cell behavior at different locations
along a linear trap, 3D optical force characterization is required. The driving force for cells or colloidal particles within
an optical trap is the thermal Brownian force where particle fluctuations can be considered a stochastic process. For
optical force quantification, we combine diode laser bar optical trapping with Gabor digital holography imaging to
perform subpixel resolution measurements of micron-sized particles positions along the laser bar. Here, diffraction
patterns produced by trapped particles illuminated by a He-Ne laser are recorded with a CMOS sensor at 1000 fps where
particle beam position reconstruction is performed using the angular spectrum method and centroid position detection.
3D optical forces are then calculated by three calibration methods: the equipartition theorem, Boltzmann probability
distribution, and power spectral density analysis for each particle in the trap. This simple approach for 3D tracking and
optical control can be implemented on any transmission microscope by adding a laser beam as the illumination source
instead of a white light source.
Paper Details
Date Published: 11 February 2011
PDF: 9 pages
Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040A (11 February 2011); doi: 10.1117/12.876010
Published in SPIE Proceedings Vol. 7904:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)
PDF: 9 pages
Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040A (11 February 2011); doi: 10.1117/12.876010
Show Author Affiliations
Mariana Potcoava, Colorado School of Mines (United States)
JILA, Univ. of Colorado and National Institute of Standards and Technology (United States)
Leo Krzewina, Univ. of South Florida (United States)
Erich Hoover, Colorado School of Mines (United States)
Myung K. Kim, Univ. of South Florida (United States)
JILA, Univ. of Colorado and National Institute of Standards and Technology (United States)
Leo Krzewina, Univ. of South Florida (United States)
Erich Hoover, Colorado School of Mines (United States)
Myung K. Kim, Univ. of South Florida (United States)
Jeff Squier, Colorado School of Mines (United States)
David W. M. Marr, Colorado School of Mines (United States)
Ralph Jimenez, JILA, Univ. of Colorado and National Institute of Standards and Technology (United States)
David W. M. Marr, Colorado School of Mines (United States)
Ralph Jimenez, JILA, Univ. of Colorado and National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 7904:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)
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