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Proceedings Paper

Polarization sensitive and Mueller matrix OCT measurements and data analysis
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Paper Abstract

The present work developed a Polarization Sensitive Optical Coherence Tomography system capable of perform birrefringence images and also determine completely the Mueller Matrix of a sample, in depth. In this way many measurements were needed to be done, with different combinations of polarization states of the incident beam on the sample and the reference arm of the interferometer. After calibrating the system, a roll of adhesive tape was used as sample for two main reasons: presents birrefringent and has a periodic structure. Firstly the system was set to gather data about the horizontal polarization state and then vertical polarization state of light to construct a birrefringence image. The birrefringence (δn) of ordinary adhesive tape was evaluated as 4.03(26)x10-4. Latter a system capable of measure any polarization state was implemented and 16 scattering profiles for different polarizations were collected. Software also was developed to solve a linear equations system. As a result a 4x4 matrix of images were calculated. Some of the features, as birefringence were easily indentified in some elements of this matrix, others, more subtle, can be founded in the literature. We also decomposed the matrix as linear combinations of other known optical elements.

Paper Details

Date Published: 11 February 2011
PDF: 9 pages
Proc. SPIE 7889, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XV, 788939 (11 February 2011); doi: 10.1117/12.875527
Show Author Affiliations
Marcus Paulo Raele, Nuclear and Energy Research Institute (Brazil)
Marcello Magri Amaral, Nuclear and Energy Research Institute (Brazil)
Nilson Dias Vieira Jr., Nuclear and Energy Research Institute (Brazil)
Anderson Zanardi de Freitas, Nuclear and Energy Research Institute (Brazil)

Published in SPIE Proceedings Vol. 7889:
Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XV
James G. Fujimoto; Joseph A. Izatt; Valery V. Tuchin, Editor(s)

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