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Proceedings Paper

Sensorless adaptive optics for microscopy
Author(s): Alexander Jesacher; Martin J. Booth
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Paper Abstract

Most implementations of adaptive optics in microscopes have not employed a wavefront sensor, but have instead used sensorless aberration correction methods. In these systems, the aberration is determined indirectly through the optimisation of a quality metric, such as image intensity. We explain the principles behind this approach and show how efficient correction schemes can be developed using suitable mathematical models. In particular, we explain how the correct choice of aberration expansion enables the independent measurement of each aberration mode via a simple quadratic maximisation.

Paper Details

Date Published: 14 February 2011
PDF: 9 pages
Proc. SPIE 7931, MEMS Adaptive Optics V, 79310G (14 February 2011); doi: 10.1117/12.875286
Show Author Affiliations
Alexander Jesacher, Innsbruck Medical Univ. (Austria)
Martin J. Booth, Univ. of Oxford (United Kingdom)

Published in SPIE Proceedings Vol. 7931:
MEMS Adaptive Optics V
Scot S. Olivier; Thomas G. Bifano; Joel A. Kubby, Editor(s)

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