Share Email Print

Proceedings Paper

Chromatic dispersion measurement of nano-silicon waveguides using a white-light interferometry method
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We report a white-light Mach-Zehnder interferometry method for an accurate measurement of spectral distribution of the chromatic dispersion coefficient of very short optical waveguides over a wavelength range of 1520~1560 nm. The chromatic dispersion curve of a 7.6 mm long silicon nano-waveguide of 400 nm width and 250 nm height was successfully measured by confirming the method with standard single-mode fibers up to 3 cm length, for which its total chromatic dispersion is as small as 0.51 fs/nm. This method will be very useful for determination of chromatic dispersion profile of compact nanowaveguide devices.

Paper Details

Date Published: 18 January 2011
PDF: 7 pages
Proc. SPIE 7942, Optoelectronic Integrated Circuits XIII, 79420R (18 January 2011); doi: 10.1117/12.874004
Show Author Affiliations
Seung Hwan Kim, Inha Univ. (Korea, Republic of)
Seoung Hun Lee, Inha Univ. (Korea, Republic of)
Dong Wook Kim, Inha Univ. (Korea, Republic of)
Kyong Hon Kim, Inha Univ. (Korea, Republic of)
El-Hang Lee, Inha Univ. (Korea, Republic of)
Jong-Moo Lee, Electronics and Telecommunications Research Institute (Korea, Republic of)

Published in SPIE Proceedings Vol. 7942:
Optoelectronic Integrated Circuits XIII
Louay A. Eldada; El-Hang Lee, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?