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Proceedings Paper

Electrical characterization of long wavelength VCSELs with tunnel junction
Author(s): A. Consoli; J. Arias; J. M. Tijero; F. J. López Hernández; I. Esquivias
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Paper Abstract

We present results on the electrical characterization of commercial fiber pigtailed 1. 55 μm 2.5 Gb/s VCSEL based on InAlGaAs active region, tunnel junction (TJ), air-gap aperture and InAlGaAs/InAlAs mirrors. The current-voltage (I-V) characteristics were measured and the results were fitted to the analytical expressions of an equivalent circuit considering the TJ in series with the active junction and a series resistance. Carrier capture/escape effects were considered in order to account for the reduced value of the drop in the measured differential resistance at threshold. The electrical parameters of both junctions were determined, showing that the TJ was responsible for most of the voltage drop at threshold. High frequency electrical impedance measurements were used to determine internal parameters as well as the role of external parasitics. The results were analyzed using a small signal equivalent circuit which includes the TJ, carrier capture/escape effects, the cavity parasitics, and the electrical access. A good agreement between the experimental and the equivalent circuit impedances at different bias was obtained by considering the differential resistances of the active and tunnel junctions extracted from the I-V characteristics, yielding reasonable values of the dynamic time constants and of the recombination coefficients.

Paper Details

Date Published: 7 February 2011
PDF: 10 pages
Proc. SPIE 7952, Vertical-Cavity Surface-Emitting Lasers XV, 79520C (7 February 2011);
Show Author Affiliations
A. Consoli, Univ. Politécnica de Madrid (Spain)
J. Arias, Univ. Miguel Hernández (Spain)
J. M. Tijero, Univ. Politécnica de Madrid (Spain)
F. J. López Hernández, Univ. Politécnica de Madrid (Spain)
I. Esquivias, Univ. Politécnica de Madrid (Spain)

Published in SPIE Proceedings Vol. 7952:
Vertical-Cavity Surface-Emitting Lasers XV
James K. Guenter; Chun Lei, Editor(s)

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