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Proceedings Paper

Feature point-based 3D mesh watermarking that withstands the cropping attack
Author(s): Mireia Montañola Sales; Rony Darazi; Joachim Giard; Patrice Rondao Alface; Benoît A. Macq
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Paper Abstract

State-of the-art robust 3D watermarking schemes already withstand combinations of a wide variety of attacks (e.g. noise addition, simplification, smoothing, etc). Nevertheless, there are practical limitations of existing 3D watermarking methods due to their extreme sensitivity to cropping. Spread Transform Dither Modulation (STDM) method is an extension of Quantization Index Modulation (QIM). Besides the simplicity and the trade-off between high capacity and robustness provided by QIM methods, it is also resistant against re-quantization. This paper focuses on two state-of-the-art techniques which offer different and complementary advantages, respectively QIM-based 3D watermarking and feature point-based watermarking synchronization. The idea is to combine both in such a way that the new scheme would benefit from the advantages of both techniques and compensate for their respective fragilities. The resulting scheme does not make use of the original 3D model in detection but of some parameters as side-information. We show that robustness against cropping and other common attacks is achieved provided that at least one feature point as well as its corresponding local neighborhood is retrieved.

Paper Details

Date Published: 10 February 2011
PDF: 10 pages
Proc. SPIE 7880, Media Watermarking, Security, and Forensics III, 78800A (10 February 2011); doi: 10.1117/12.872585
Show Author Affiliations
Mireia Montañola Sales, Univ. Catholique de Louvain (Belgium)
Rony Darazi, Univ. Catholique de Louvain (Belgium)
Joachim Giard, Univ. Catholique de Louvain (Belgium)
Patrice Rondao Alface, Alcatel-Lucent Bell Labs. (Belgium)
Benoît A. Macq, Univ. Catholique de Louvain (Belgium)

Published in SPIE Proceedings Vol. 7880:
Media Watermarking, Security, and Forensics III
Nasir D. Memon; Jana Dittmann; Adnan M. Alattar; Edward J. Delp III, Editor(s)

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