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Proceedings Paper

Window-based spectral analysis of color halftone screens
Author(s): Ahmed H. Eid; Brian E. Cooper; Edward E. Rippetoe
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Paper Abstract

Improper design of color halftone screens may create visually objectionable moire patterns in the final prints due to the interaction between the halftone screens of the color primaries. The prediction of such interactions from the screens' bitmaps helps to identify and avoid problematic patterns, reducing the time required to design effective color halftone screens. In this paper, we detect the moire patterns by examining the spatial frequency spectra of the superimposed screens. We study different windowing techniques including Hann, Hamming, and Blackman, to better estimate the moire strength, frequency and orientation. The window-based spectral estimation has the advantage of reducing the effect of spectral leakage associated with the non-windowed discrete signals. Two methods are used to verify the detected moire from the bitmaps. First, we analyze scans of the printed halftones, using the same technique that we applied to the bitmaps. Second, we independently inspect the printed halftones visually. Our experiments show promising results by detecting the moire patterns from both the bitmap images as well as the scans of the actual prints verified by visual inspection.

Paper Details

Date Published: 25 January 2011
PDF: 9 pages
Proc. SPIE 7866, Color Imaging XVI: Displaying, Processing, Hardcopy, and Applications, 78661G (25 January 2011); doi: 10.1117/12.872542
Show Author Affiliations
Ahmed H. Eid, Lexmark International, Inc. (United States)
Brian E. Cooper, Lexmark International, Inc. (United States)
Edward E. Rippetoe, Lexmark International, Inc. (United States)


Published in SPIE Proceedings Vol. 7866:
Color Imaging XVI: Displaying, Processing, Hardcopy, and Applications
Reiner Eschbach; Gabriel G. Marcu; Alessandro Rizzi, Editor(s)

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