Share Email Print

Proceedings Paper

High-resolution Crop Surface Models (CSM) and Crop Volume Models (CVM) on field level by terrestrial laser scanning
Author(s): Dirk Hoffmeister; Andreas Bolten; Constanze Curdt; Guido Waldhoff; Georg Bareth
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The interdisciplinary Transregional Collaborative Research Center 32 (CRC/TR 32) works on exchange processes between soil, vegetation, and the adjacent atmospheric boundary layer (SVA). Within this research project a terrestrial laser scanning sensor is used in a multitemporal approach for determining agricultural plant parameters. In contrast to other studies with phase-change or optical probe sensors, time-of-flight measurements are used. On three dates in the year 2008 a sugar beet field (4.3 ha) in Western Germany was surveyed by a terrestrial laser scanner (Riegl LMS-Z420i). Point clouds are georeferenced, trimmed, and compared with official elevation data. The estimated plant parameters are (i) surface model comparison between different crop surfaces and (ii) crop volumes as well as (iii) soil roughness parameters for SVA-Modelling. The results show, that the estimation of these parameters is possible and the method should be validated and extended.

Paper Details

Date Published: 3 November 2010
PDF: 6 pages
Proc. SPIE 7840, Sixth International Symposium on Digital Earth: Models, Algorithms, and Virtual Reality, 78400E (3 November 2010); doi: 10.1117/12.872315
Show Author Affiliations
Dirk Hoffmeister, Univ. of Cologne (Germany)
Andreas Bolten, Univ. of Cologne (Germany)
Constanze Curdt, Univ. of Cologne (Germany)
Guido Waldhoff, Univ. of Cologne (Germany)
Georg Bareth, Univ. of Cologne (Germany)

Published in SPIE Proceedings Vol. 7840:
Sixth International Symposium on Digital Earth: Models, Algorithms, and Virtual Reality
Huadong Guo; Changlin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?