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Proceedings Paper

Line and streak detection on polished and textured surfaces using line integrals
Author(s): M. Sezer Erkilinc; Mustafa Jaber; Eli Saber; Robert Pearson
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Paper Abstract

In this paper, a framework for detecting lines in a polished or textured substrate is proposed. Modules for image capture, rectification, enhancement, and line detection are included. If the surface being examined is specular (mirror-like), the image capture will be restricted, that is, the camera has to be fixed off-axis in the zenith direction. A module for image rectification and projection is included to overcome this limitation in order to yield an orthographic image. In addition, a module for image enhancement that includes high-boost is employed to improve the edge sharpness and decrease the spatial noise in the image. Finally, a line-integral technique is applied to find the confidence vectors that represent the spatial positions of the lines of interest. The Full-Width at Half-Max (FWHM) approximation is applied to determine the corresponding lines in a target image. Experimental results show that our technique has an effective performance on synthetic and real images. Print quality assessment is the main application of the proposed algorithm; however, it can be used to detect lines/ streak in prints, on substrate or any type of media where lines are visible.

Paper Details

Date Published: 4 February 2011
PDF: 8 pages
Proc. SPIE 7870, Image Processing: Algorithms and Systems IX, 787008 (4 February 2011); doi: 10.1117/12.872189
Show Author Affiliations
M. Sezer Erkilinc, Rochester Institute of Technology (United States)
Mustafa Jaber, Rochester Institute of Technology (United States)
Eli Saber, Rochester Institute of Technology (United States)
Robert Pearson, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 7870:
Image Processing: Algorithms and Systems IX
Jaakko T. Astola; Karen O. Egiazarian, Editor(s)

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