
Proceedings Paper
Study on testing resolution of optical systemFormat | Member Price | Non-Member Price |
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Paper Abstract
Resolution of optical system is a critical index to judge the quality of optical system. Measuring the
resolution of optical system has become more and more important in optical measurement. But
traditionally the method to evaluate the resolution of optical system is mainly subjective because of
man's eye seeing. Although this method is simple and intuitive, it is very easy for the introduction of
the subjective error. To solve this problem, an approach based on digital image processing technique is
brought out to achieve this subjective processing in this paper. An experiment is done to grasp image of
resolving power test target formed by a teleobjective, its extreme resolution is obtained. The result
matches ideal resolution by calculation. This way has the advantage of rapid processing and objective.
It is the tendency of measuring resolution in the future.
Paper Details
Date Published: 9 November 2010
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 784932 (9 November 2010); doi: 10.1117/12.871777
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 784932 (9 November 2010); doi: 10.1117/12.871777
Show Author Affiliations
Shaojun Lu, Xi'an Technological Univ. (China)
Xi'an Jiaotong Univ. (China)
Xiaolin Zhang, Xuchang Vocational and Technical College (China)
Rongli Guo, Xi'an Technological Univ. (China)
Xi'an Jiaotong Univ. (China)
Xiaolin Zhang, Xuchang Vocational and Technical College (China)
Rongli Guo, Xi'an Technological Univ. (China)
Jun Wu, Xi'an Technological Univ. (China)
Jun Han, Xi'an Technological Univ. (China)
Cunli Duan, Xi'an Technological Univ. (China)
Jun Han, Xi'an Technological Univ. (China)
Cunli Duan, Xi'an Technological Univ. (China)
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
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