
Proceedings Paper
Research on measuring optical transfer functionFormat | Member Price | Non-Member Price |
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Paper Abstract
Optical transfer function (OTF) of optical system is an important character to show optical system's
imaging quality. It is important to accurately obtain the OTF in optical measurement. But traditional
methods encountered some difficulties in high-precision measurement. A new approach based on
digital image processing technique (DIP) is proposed in this paper. An experiment is done to acquire
the image of a pill and a CCD is used to acquire digital images. Optical-electronic focal plane fixing
technology is adopted to obtain a more accurate image. Then the images are done by digital image
processing, including filtering and Fast Fourier Transform, and the 2-dimension modulated transfer
function (MTF) is obtained. The MTF of this detected lens derived from this way is compared with a
higher accurate equipment to measure the OTF of the same lens, the results have some differences.
The reason is analyzed in this paper. This method will be widely used in optical inspection.
Paper Details
Date Published: 9 November 2010
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 784931 (9 November 2010); doi: 10.1117/12.871724
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 784931 (9 November 2010); doi: 10.1117/12.871724
Show Author Affiliations
Shaojun Lu, Xi'an Technological Univ. (China)
Xi'an Jiaotong Univ. (China)
Xiaolin Zhang, Xuchang Vocational and Technical College (China)
Rongli Guo, Xi'an Technological Univ. (China)
Xi'an Jiaotong Univ. (China)
Xiaolin Zhang, Xuchang Vocational and Technical College (China)
Rongli Guo, Xi'an Technological Univ. (China)
Dong Xia, Xi'an Technological Univ. (China)
Jianming Yu, Xi'an Technological Univ. (China)
Jun Han, Xi'an Technological Univ. (China)
Jianming Yu, Xi'an Technological Univ. (China)
Jun Han, Xi'an Technological Univ. (China)
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
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