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Proceedings Paper

Phase shift based measurements using a pocket LCD projector
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Paper Abstract

Phase shifting based measurements have been well established for use in both interferometry and structured light based measurements. The use of modern LCD, DLP or LCOS based projectors to create and shift projected patterns for use in phase shifting systems has provided new capabilities such as pattern masking, adjustable resolutions and active preprocessing, along with many challenges. Now the latest consumer projection technology has made available low cost, pocket-sized projectors, some with built in memory. These small projectors open up the possibility of mini-phase shift systems, as well as the possibility of portable measurement systems. This paper explores some of the possibilities for systems made with pocket size pattern projectors, and what some of the limitations may be that will need to be overcome. Experimental data will be presented that illustrates some of these challenges.

Paper Details

Date Published: 11 November 2010
PDF: 8 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550E (11 November 2010); doi: 10.1117/12.871214
Show Author Affiliations
Yana Williams, GE Global Research (United States)
Kevin Harding, GE Global Research (United States)

Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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