Proceedings Paper
Sinusoidal wavelength-scanning common-path interferometer with a beam-scanning system for measurement of film thickness variations| Format | Member Price | Non-Member Price |
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Paper Abstract
Two light beams reflected from a front and rear surfaces of a glass film of 20 micron thickness interfere with
each other in a common path interferometer. Sinusoidal wavelength-scanning light with the scanning amplitude
of 5 nm and frequency of 15 KHz is used to generate a sinusoidal phase-modulated interference signal with the
modulation amplitude of 2.6 rad. The phase of the interference signal provides the thickness variation of the film,
whose measurement accuracy is a few nanometers. Moreover, in order to achieve a high spatial resolution and a
wide measurement region a focused beam is scanned on the surface of the film with a rotating mirror.
Paper Details
Date Published: 11 November 2010
PDF: 6 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550S (11 November 2010); doi: 10.1117/12.871030
Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
PDF: 6 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78550S (11 November 2010); doi: 10.1117/12.871030
Show Author Affiliations
Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)
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