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Proceedings Paper

Lifetime estimation of high power lasers
Author(s): Guoguang Lu; Yun Huang; Yunfei En
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Paper Abstract

We have set up a computer automated controlled diode array reliability experiment which can take up 10 to 20 high power cm-bars. Subsequent 25°C and 50°C lifetime tests were completed. According to the method of least squares, the degradation model of cm-bars is obtained. Using the model and weibull++7 software, the extrapolated lifetime of cmbars at 25°C is 7950 hours (2.86×109 shots). We also obtain an acceleration factor 1.88 of resulting in a thermal activation energy of Ea=0.21eV using Arrhenius function. Finally, failure analysis was carried on the gradually degraded devices, the results show that it is the facet degradation which made high power cm-bars degrade during the long time lifetime test.

Paper Details

Date Published: 12 November 2010
PDF: 7 pages
Proc. SPIE 7844, Semiconductor Lasers and Applications IV, 784413 (12 November 2010); doi: 10.1117/12.870751
Show Author Affiliations
Guoguang Lu, Science and Technology on Reliability Physics and Application of Electronic Component Lab. (China)
Yun Huang, Science and Technology on Reliability Physics and Application of Electronic Component Lab. (China)
Yunfei En, Science and Technology on Reliability Physics and Application of Electronic Component Lab. (China)


Published in SPIE Proceedings Vol. 7844:
Semiconductor Lasers and Applications IV
Ning-Hua Zhu; Jinmin Li; Farzin Amzajerdian; Hiroyuki Suzuki, Editor(s)

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