
Proceedings Paper
A sub-aperture scanning method for detecting wavefront of long-focus lensFormat | Member Price | Non-Member Price |
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Paper Abstract
To detect the wavefront of a long-focus lens, a new method is proposed in this paper. It is based on two dimensional
sub-aperture scanning and model method reconstruction. The number of stripes moved from one sub-aperture to another
has a relationship with the wavefront slope. In most cases it can be approached to linear relation. Through scanning the
initial wavefront slope data are achieved. Then with the slope data, the wavefront is reconstructed by model method with
Zernike polynomials. Singular value decomposition method is used in the process of solving the matrix equation.
Stripe-counting is one of the most important contents, which plays a decisive role in getting an accurate experimental
result. The method's precision is validated after comparing it with laser interferometer. It also works in some situations
that interferometer will not be suitable to detect a long-focus and large-diameter lens.
Paper Details
Date Published: 9 November 2010
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78492P (9 November 2010); doi: 10.1117/12.870537
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78492P (9 November 2010); doi: 10.1117/12.870537
Show Author Affiliations
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
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