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Proceedings Paper

In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm
Author(s): Y. Arai; M. Kikukawa; S. Yokozeki
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Paper Abstract

Dynamic deformation measurement with a large in-plane deformation is performed by using virtual speckle patterns. The virtual speckle pattern has been generally produced by using Fourier technology. However, it takes a long calculating time to produce a virtual speckle pattern under Fourier technology, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by Carré algorithm without any operation by Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is almost equal to the ordinary methods in measurement accuracy.

Paper Details

Date Published: 13 September 2010
PDF: 8 pages
Proc. SPIE 7387, Speckle 2010: Optical Metrology, 738710 (13 September 2010); doi: 10.1117/12.870461
Show Author Affiliations
Y. Arai, Kansai Univ. (Japan)
M. Kikukawa, Kansai Univ. (Japan)
S. Yokozeki, Jyouko Applied Optics Lab. (Japan)

Published in SPIE Proceedings Vol. 7387:
Speckle 2010: Optical Metrology
Armando Albertazzi Goncalves Jr.; Guillermo H. Kaufmann, Editor(s)

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