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Proceedings Paper

Temperature measurement of contact resistance based on infrared detection
Author(s): De En; Jieyu Feng
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Paper Abstract

For science and technology, the level of science and technology is determined by the measurement accuracy and efficiency to some extent. Contact resistance can not be ignored in precise measurement. Because the measured object is not directly contacted with infrared measurement device, there is no friction. Infrared measurement has the advantage of high sensitivity, fast response and so on. In this paper, the reasons for the temperature rising of the contact resistance and its harm and the importance of measuring the temperature of the contact resistance in precise measurement are analyzed firstly; then some theories of the infrared detection technology are introduced; finally, an infrared temperature measurement system based on SCM is designed.

Paper Details

Date Published: 4 November 2010
PDF: 8 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785438 (4 November 2010); doi: 10.1117/12.870064
Show Author Affiliations
De En, Henan Polytechnic Univ. (China)
Jieyu Feng, Henan Polytechnic Univ. (China)

Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

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