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Proceedings Paper

Microrheology of sodium polystyrene sulfonate (NaPSS) solutions with different polymer concentrations and molecular weights studied by diffusing wave spectroscopy
Author(s): Yin-Quan Chen; Chen-Yu Cheng; Chia-Chun Chiang; Ming-Tzo Wei; Yi-Chiao Huang; Olivier Lavastre; Husson Guillaume; Darsy Guillaume; Arthur Chiou
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Paper Abstract

In this paper, we report the viscoelastic properties of sodium polystyrene sulfonate (NaPSS) solution with different concentrations (in the range of 10-4 M to 10-3 M) and with different molecular weights (70 kDa vs. 200 kDa) investigated via Diffusing Wave Spectroscopy (DWS). The viscoelastic properties of the sample solutions are characterized in terms of the elastic modulus G' and the viscous modulus G" as a function of frequency (f), and also in terms of the polymer disentanglement time (τ); the effect of polymer concentration and molecular weight on these parameters are presented. Our experimental results indicate that (1) both the viscous modulus G" and the disentanglement time (τ) increase with molecular concentration, whereas the elastic modulus G' is relatively insensitive to molecular concentration, and (2) for the same concentration, all the 3 parameters (i.e., the elastic modulus G', the viscous modulus G", and disentanglement time τ) increase as the molecular weight increases.

Paper Details

Date Published: 5 November 2010
PDF: 9 pages
Proc. SPIE 7848, Holography, Diffractive Optics, and Applications IV, 78480H (5 November 2010); doi: 10.1117/12.870005
Show Author Affiliations
Yin-Quan Chen, National Yang-Ming Univ. (Taiwan)
Chen-Yu Cheng, National Tsing Hua Univ. (Taiwan)
Chia-Chun Chiang, National Yang-Ming Univ. (Taiwan)
Ming-Tzo Wei, Lehigh Univ. (United States)
Yi-Chiao Huang, National Yang-Ming Univ. (Taiwan)
Olivier Lavastre, Univ. de Rennes 1 (France)
Husson Guillaume, Univ. de Rennes 1 (France)
Darsy Guillaume, Univ. de Rennes 1 (France)
Arthur Chiou, National Yang-Ming Univ. (Taiwan)

Published in SPIE Proceedings Vol. 7848:
Holography, Diffractive Optics, and Applications IV
Yunlong Sheng; Chongxiu Yu; Linsen Chen, Editor(s)

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