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Proceedings Paper

Side-chain polymers bearing azo-moieties for nonlinear optics
Author(s): F. Adriana Nicolescu; V. Victor Jerca; Ioan Dancus; Adrian Petris; Valentin I. Vlad; D. Sorin Vasilescu; D. Mircea Vuluga
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Paper Abstract

In this paper we present a series of side-chain polymers bearing original azo-moieties, namely: poly(methacrylate)s and poly(maleimide-styrene)s; designed for nonlinear optics (NLO). The different classes of azopolymers are discussed comparatively to one another from the point of view of: solubility, molar weights, glass transition temperatures & thermal stability, chromophore contents, and as well as from the point of view of their third-nonlinear response. The third-order nonlinear absorptive and refractive effect of the polymers containing different substituted azobenzene chromophores were investigated by the Z-scan technique. The effect of substituents on the azobenzene group and the composition of the polymer chain were investigated by UV-Vis spectroscopy.

Paper Details

Date Published: 12 October 2010
PDF: 7 pages
Proc. SPIE 7838, Optics and Photonics for Counterterrorism and Crime Fighting VI and Optical Materials in Defence Systems Technology VII, 78381B (12 October 2010); doi: 10.1117/12.869885
Show Author Affiliations
F. Adriana Nicolescu, Costin D. Nenitescu Institute of Organic Chemistry (Romania)
V. Victor Jerca, Costin D. Nenitescu Institute of Organic Chemistry (Romania)
Ioan Dancus, National Institute for Laser, Plasma and Radiation Physics (Romania)
Adrian Petris, National Institute for Laser, Plasma and Radiation Physics (Romania)
Valentin I. Vlad, National Institute for Laser, Plasma and Radiation Physics (Romania)
D. Sorin Vasilescu, Polytechnical Univ. of Bucharest (Romania)
D. Mircea Vuluga, Costin D. Nenitescu Institute of Organic Chemistry (Romania)


Published in SPIE Proceedings Vol. 7838:
Optics and Photonics for Counterterrorism and Crime Fighting VI and Optical Materials in Defence Systems Technology VII
Colin Lewis; Roberto Zamboni; François Kajzar; Doug Burgess; Emily M. Heckman, Editor(s)

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