
Proceedings Paper
Surface damage mitigation of fused silica with CO2 laserFormat | Member Price | Non-Member Price |
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Paper Abstract
CO2 laser with 10.6μm wavelength radiate on damage with size below 80μm. Through examining with 351nm
wavelength ultra-violet, it is found the larger damage size is, the lower extent of damage threshold is enhanced. During
mitigation, thermal stress resulted from short interaction time and asymmetrical temperature distribution. Radial crack
generates after damage and could expand if exposed to ultraviolet laser. After annealed in an oven for 9 hours, crack in
the sample was eliminated.
Paper Details
Date Published: 6 October 2010
PDF: 7 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765533 (6 October 2010); doi: 10.1117/12.869088
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
PDF: 7 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765533 (6 October 2010); doi: 10.1117/12.869088
Show Author Affiliations
Xi-Bin Li, China Academy of Engineering Physics (China)
Hai-Bing Lv, China Academy of Engineering Physics (China)
Xia Xiang, China Academy of Engineering Physics (China)
Hai-Jun Wang, China Academy of Engineering Physics (China)
Hai-Bing Lv, China Academy of Engineering Physics (China)
Xia Xiang, China Academy of Engineering Physics (China)
Hai-Jun Wang, China Academy of Engineering Physics (China)
Meng Chen, China Academy of Engineering Physics (China)
Xiao-Dong Yuan, China Academy of Engineering Physics (China)
Wan-Guo Zheng, China Academy of Engineering Physics (China)
Xiao-Dong Yuan, China Academy of Engineering Physics (China)
Wan-Guo Zheng, China Academy of Engineering Physics (China)
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
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