
Proceedings Paper
Compensation ability evaluation of part-compensation lens based on slope asphericityFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The accurate evaluation on the compensation range of part-compensation lens is beneficial to guide the design of
part-compensation lens and realize fast testing on many aspheric surfaces. The prior evaluation methods based on
asphericity have error judge occurred, thus reduce the compensation range of part-compensation lens negatively, further
increase the testing time of aspheric surface. Therefore, an evaluation method based on slope asphericity that fits testing
requirements is proposed to evaluate the compensation range of part-compensation lens. Mass simulations are processed
to compare different evaluations and the effect of aspheric surface parameters on compensation range evaluation is
analyzed. Additionally, the operation mechanism of part-compensation lens is analyzed from slope match of rays. The
results indicate that accurate evaluation can be realized via using slope asphericity, thus is beneficial to design a
part-compensation lens with the compensation range as large as possible.
Paper Details
Date Published: 9 November 2010
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78491M (9 November 2010); doi: 10.1117/12.869062
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78491M (9 November 2010); doi: 10.1117/12.869062
Show Author Affiliations
Feng Xie, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiudong Zhu, Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiudong Zhu, Beijing Institute of Technology (China)
Lei Tang, Beijing Institute of Technology (China)
Beijing Institute of Special Electromechanical Technology (China)
Yao Hu, Beijing Institute of Technology (China)
Beijing Institute of Special Electromechanical Technology (China)
Yao Hu, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)
© SPIE. Terms of Use
