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Proceedings Paper

Design and analysis of a sub-aperture scanning machine for the transmittance measurements of large-aperture optical system
Author(s): Yingwei He; Ping Li; Guojin Feng; Li Cheng; Yu Wang; Houping Wu; Zilong Liu; Chundi Zheng; Dingguo Sha
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Paper Abstract

For measuring large-aperture optical system transmittance, a novel sub-aperture scanning machine with double-rotating arms (SSMDA) was designed to obtain sub-aperture beam spot. Optical system full-aperture transmittance measurements can be achieved by applying sub-aperture beam spot scanning technology. The mathematical model of the SSMDA based on a homogeneous coordinate transformation matrix is established to develop a detailed methodology for analyzing the beam spot scanning errors. The error analysis methodology considers two fundamental sources of scanning errors, namely (1) the length systematic errors and (2) the rotational systematic errors. As the systematic errors of the parameters are given beforehand, computational results of scanning errors are between -0.007~0.028mm while scanning radius is not lager than 400.000mm. The results offer theoretical and data basis to the research on transmission characteristics of large optical system.

Paper Details

Date Published: 9 November 2010
PDF: 9 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78491K (9 November 2010); doi: 10.1117/12.869044
Show Author Affiliations
Yingwei He, Beijing Institute of Technology (China)
Ping Li, National Institute of Metrology (China)
Guojin Feng, National Institute of Metrology (China)
Li Cheng, National Institute of Metrology (China)
Yu Wang, National Institute of Metrology (China)
Houping Wu, National Institute of Metrology (China)
Zilong Liu, National Institute of Metrology (China)
Chundi Zheng, National Institute of Metrology (China)
Dingguo Sha, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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