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Proceedings Paper

A simulation imaging method for actual optical system and results analysis
Author(s): Fen Neng; Qiangsheng Liu; Hongbo Shang; Zhaofeng Cen; Xiaotong Li
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Paper Abstract

The image quality is the most direct method for evaluating actual optical system's quality. Imaging of standard feather image, such as resolution plate, comet and so on is also frequently used in lens test in optical industry. The existing simulation method for optical system can be divided into two categories. One is using ideal optical system model to simulate image the object formed, but the actual parameters, aberration, processing and assembly of the optical system cannot be considered. The other can calculate the special field's Spot Diagram, Point Spread Function and Module Transfer Function by the optical design software. It is widely used for optimization (design) and image restoration. In this paper, the actual optical system is simulated by our self-developed simulation software, the target image is entered, the ray tracing method is used and the simulated image is received, which is formed by the object image of the practical optical system with errors. Known parameters of the optical system are used in this article. The correctness of simulation results is demonstrated. And the targeted photorealistic images with colors and photometric information can be gotten by the simulation software, and the more rays be used, the more fields be cut, the simulated image much closer to the actual image. The errors possible existing in optical system processing and assembly, such as eccentric, tilt or surface error are considered in our simulation software, and the simulated image we get is affected by these factors. So that we can give the reasonable tolerances, speed up the development efficiency and reduce cost.

Paper Details

Date Published: 5 November 2010
PDF: 6 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78490E (5 November 2010); doi: 10.1117/12.869009
Show Author Affiliations
Fen Neng, Zhejiang Univ. (China)
Qiangsheng Liu, Zhejiang Univ. (China)
Hongbo Shang, Zhejiang Univ. (China)
Zhaofeng Cen, Zhejiang Univ. (China)
Xiaotong Li, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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