
Proceedings Paper
A circular micro-grating array for Shack Hartmann wavefront sensorsFormat | Member Price | Non-Member Price |
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Paper Abstract
A novel micro-grating array for Shack Hartmann wavefront sensors is presented. This circular micro-grating array shows
obvious advantage in matching circular aperture. It also provides a potential way of decreasing the expense of Shack
Hartmann wavefront sensors for its easy design and manufacturing procedure. An implementation is shown together with
experimental and measuring results. With this circular micro-grating array, a circular aperture can be matched by 100%,
which can avoid the lost of useful information when testing and measuring, at the same time, the regular focal spots array
will adapt to the common detectors which are always rectangular. In addition, another design and implementation of one
dimensional micro-grating array is also presented by which a higher efficiency will be available.
Paper Details
Date Published: 11 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76567I (11 October 2010); doi: 10.1117/12.867501
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76567I (11 October 2010); doi: 10.1117/12.867501
Show Author Affiliations
Haiying Wang, Institute of Optics and Electronics (China)
Ling Wei, Institute of Optics and Electronics (China)
Ling Wei, Institute of Optics and Electronics (China)
Jie Chen, Institute of Optics and Electronics (China)
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
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